IEEE DEIS Hosts Workshop on Smart Grid Technologies

In June 2015, the Dielectrics and Electrical Insulation Society (DEIS) hosted a workshop on Smart Grid Technologies in Seattle, Washington, USA.

The major applied research conference of the IEEE DEIS is the annual Electrical Insulation Conference. The day before the conference, DEIS hosted a full day workshop on “The Impact of Smart Grid Technologies on Plant Health,” with seven speakers on diverse topics under this theme. The workshop was attended by graduate students and active researchers, and a panel discussion identified further activities where the DEIS Technical Committee on Smart Grids could focus their efforts.

The workshop was chaired by Victoria Catterson from the University of Strathclyde. Professor Catterson covered two broad topics including: (1) the potential for the smart grid to bring improved devices, through self-healing capabilities, and novel sensing technologies to achieve self-managing systems, and (2) new usage patterns, where the operation and maintenance of traditional assets has to adapt to accommodate changes to load profiles and ratings, and new methods of modelling asset health and deterioration.

Other major topics covered during the workshop included:

  • HVDC Cable Systems presented by Jerome Castellon of Université de Montpellier
  • A Smart Grid Approach to Condition Based Maintenance of Energy Assets presented by Gian Carlo Montanari of Universita di Bologna
  • Changing Load Patterns presented by James Pilgrim of the University of Southampton
  • The use of Special Dielectrics in Smart Grid Energy Harvesting Systems presented by Peter Morshuis of Delft University of Technology
  • Electromagnetic Compatibility Issues in the Smart Grid presented by Kaori Fukunaga of the National Institute of Information and Communication Technology
  • Situational Awareness for Generating Units presented by Brian Sparling of Dynamic Ratings Inc.
  • Future Direction Discussion for the DEIS

More information on the workshop may be found here:

Stay Informed - Join the IEEE Smart Grid Community Today